The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2020

Filed:

Oct. 02, 2019
Applicant:

Anritsu Corporation, Kanagawa, JP;

Inventors:

Tomohiko Maruo, Kanagawa, JP;

Aya Yamamoto, Kanagawa, JP;

Assignee:

ANRITSU CORPORATION, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2015.01); H04B 17/15 (2015.01); H01Q 15/14 (2006.01); H01Q 3/18 (2006.01);
U.S. Cl.
CPC ...
H04B 17/15 (2015.01); H01Q 3/18 (2013.01); H01Q 15/14 (2013.01);
Abstract

An measurement apparatus (antenna apparatus)includes: an OTA chamberhaving an internal spacethat is not influenced by the surrounding radio wave environment; a reflectorthat is housed in the internal space, radio signals transmitted or received by an antennaof a DUTbeing reflected through a paraboloid of revolution; a plurality of test antennasthat use radio signals in a plurality of measurement target frequency bands for measuring the transmission and reception characteristics of the DUT; and automatic antenna arrangement meansfor sequentially arranging each of the test antennasat a focal position F, which is determined from the paraboloid of revolution, according to the measurement target frequency bands.


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