The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2020
Filed:
May. 17, 2018
Winbond Electronics Corp., Taichung, TW;
Jun-Lin Yeh, Taichung, TW;
Winbond Electronics Corp., Taichung, TW;
Abstract
An inspection method for memory integrity, a non-volatile memory, and an electronic device are provided. The method includes following steps. A threshold voltage of at least one memory cell to-be-inspected in a non-volatile memory is obtained. A data value belonging to the at least one memory cell to-be-inspected is determined by comparing a read voltage and the threshold voltage. When the data value belonging to the at least one memory cell to-be-inspected is determined, a preset voltage is set according to the data value. An offset data value belonging to the at least one memory cell to-be-inspected is obtained by comparing the preset voltage and the threshold voltage of the at least one memory cell to-be-inspected. And, whether the data value and the offset data value belonging to the at least one memory cell to-be-inspected are the same is determined, so as to determine whether an integrity of the memory cell to-be-inspected is defective.