The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2020
Filed:
Jan. 04, 2017
Applicant:
Intel Corporation, Santa Clara, CA (US);
Inventor:
Franz P. Clarberg, Lund, SE;
Assignee:
Intel Corporation, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 17/20 (2006.01); G06T 15/04 (2011.01); G06T 15/20 (2011.01); G06T 15/40 (2011.01); G06T 11/00 (2006.01); G06T 15/00 (2011.01); G06T 15/50 (2011.01);
U.S. Cl.
CPC ...
G06T 17/20 (2013.01); G06T 11/001 (2013.01); G06T 15/005 (2013.01); G06T 15/04 (2013.01); G06T 15/205 (2013.01); G06T 15/405 (2013.01); G06T 15/503 (2013.01); G06T 2210/12 (2013.01);
Abstract
Stochastic rasterization may be used as a flexible volumetric sampling mechanism. By bounding and tessellating the sampling domain, uniform sampling distributions over an arbitrary domain can be efficiently generated in up to five dimensions. Sample placement allows pseudo-random, stratified random, or blue noise sampling. Random sampling with an adaptive density function may be achieved by adding one dimension.
Clarberg, Franz. (2020). Generating random sampling distributions using stochastic rasterization (U.S. Patent No. 10762700). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10762700
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile