The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2020
Filed:
Apr. 13, 2018
Sas Institute Inc., Cary, NC (US);
Aysu Ezen Can, Cary, NC (US);
Ning Jin, Morrisville, NC (US);
Ethem F. Can, Cary, NC (US);
Xiangqian Hu, Cary, NC (US);
Saratendu Sethi, Raleigh, NC (US);
SAS INSTITUTE INC., Cary, NC (US);
Abstract
Machine-learning models and behavior can be visualized. For example, a machine-learning model can be taught using a teaching dataset. A test input can then be provided to the machine-learning model to determine a baseline confidence-score of the machine-learning model. Next, weights for elements in the teaching dataset can be determined. An analysis dataset can be generated that includes a subset of the elements that have corresponding weights above a predefined threshold. For each overlapping element in both the analysis dataset and the test input, (i) a modified version of the test input can be generated that excludes the overlapping element, and (ii) the modified version of the test input can be provided to the machine-learning model to determine an effect of the overlapping element on the baseline confidence-score. A graphical user interface can be generated that visually depicts the test input and various elements' effects on the baseline confidence-score.