The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2020

Filed:

Oct. 10, 2018
Applicant:

Carl Zeiss Microscopy Gmbh, Jena, DE;

Inventor:

Alexander Gaiduk, Jena, DE;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); G02B 21/36 (2006.01); G02B 21/06 (2006.01); G02B 21/24 (2006.01); H04N 5/235 (2006.01); G02B 21/02 (2006.01); G02B 21/26 (2006.01);
U.S. Cl.
CPC ...
G02B 21/367 (2013.01); G02B 21/06 (2013.01); G02B 21/241 (2013.01); H04N 5/2351 (2013.01); H04N 5/2354 (2013.01); G02B 21/02 (2013.01); G02B 21/26 (2013.01);
Abstract

The present invention relates firstly to a method for acquiring a stack of microscopic images of a specimen. The microscopic images of the stack are acquired from different focus positions. According to the invention, a plurality of the microscopic images of the specimen are respectively acquired from at least some of the focus positions using different settings of an illumination unit for illuminating the specimen. According to the invention, the illumination settings with which the microscopic images of the specimen are acquired is decided upon individually in each case at least for several of the focus positions. The invention further relates to a digital microscope for microimaging a specimen.


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