The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2020

Filed:

Aug. 25, 2017
Applicant:

Tektronix, Inc., Beaverton, OR (US);

Inventors:

Michael J. Mende, Portland, OR (US);

David T. Engquist, Portland, OR (US);

Richard A. Booman, Lake Oswego, OR (US);

Assignee:

Tektronix, Inc., Beaverton, OR (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 1/18 (2006.01); G01R 1/067 (2006.01); G01R 1/04 (2006.01);
U.S. Cl.
CPC ...
G01R 1/18 (2013.01); G01R 1/0416 (2013.01); G01R 1/06738 (2013.01); G01R 1/06772 (2013.01);
Abstract

Disclosed is a differential test probe tip. The probe tip comprises a socket of electrically conductive material at a proximate end of the probe tip. The socket includes a concavity to receive a signal pin. The probe tip also comprises a reference body of conductive material surrounding the socket. The probe tip further comprises a insulating spacer element of non-conductive material surrounding the reference body at the proximate end of the probe tip. The insulating spacer element includes a signal port to receive the signal pin into the socket. The insulating spacer element further includes a reference port to receive a reference pin and maintain the reference pin in electrical communication with a proximate end of the reference body.


Find Patent Forward Citations

Loading…