The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2020

Filed:

Jan. 17, 2019
Applicant:

Mitutoyo Corporation, Kanagawa, JP;

Inventors:

Kozo Ariga, Tokyo, JP;

Gyokubu Cho, Kanagawa, JP;

Hidemitsu Asano, Kanagawa, JP;

Masato Kon, Kanagawa, JP;

Assignee:

MITUTOYO CORPORATION, Kanagawa, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/046 (2018.01);
U.S. Cl.
CPC ...
G01N 23/046 (2013.01); G01N 2223/3306 (2013.01); G01N 2223/419 (2013.01);
Abstract

An X-ray CT measuring apparatus configured to emit an X-ray from an X-ray source while rotating a subject arranged on a rotary table, and obtain a tomographic image of the subject by reconstructing projection images, includes an imaging unit for imaging the subject on the rotary table from above or sideways, an obtaining unit for obtaining an image of the subject while rotating the subject, a calculating unit for calculating a maximum outer diameter of the subject during rotation by using the obtained image of the subject, and a setting unit for setting a movement limit of the rotary table on the basis of the maximum outer diameter.


Find Patent Forward Citations

Loading…