The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2020

Filed:

Aug. 16, 2018
Applicant:

Mitutoyo Corporation, Kanagawa-ken, JP;

Inventor:

Michael Nahum, Seattle, WA (US);

Assignee:

Mitutoyo Corporation, Kanagawa-ken, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B25J 9/16 (2006.01); B25J 17/02 (2006.01);
U.S. Cl.
CPC ...
B25J 9/1697 (2013.01); B25J 9/1664 (2013.01); B25J 17/0258 (2013.01);
Abstract

A supplementary metrology position coordinates determination system is provided for use with an articulated robot. A first accuracy level defined as a robot accuracy (e.g., for controlling and sensing an end tool position of an end tool that is coupled to a robot arm portion that moves in an XY plane), is based on using position sensors (e.g., rotary encoders) included in the robot. The supplementary system includes an imaging configuration, XY scale, image triggering portion and processing portion. One of the XY scale or imaging configuration is coupled to the robot arm portion and the other is coupled to a stationary element (e.g., a frame located above the robot). The imaging configuration acquires an image of the XY scale, which is utilized to determine a relative position that is indicative of the end tool position, with an accuracy level that is better than the robot accuracy.


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