The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2020

Filed:

Feb. 28, 2017
Applicant:

Mitsubishi Materials Corporation, Tokyo, JP;

Inventors:

Shun Sato, Anpachi-gun, JP;

Tsuyoshi Ogami, Naka, JP;

Koichi Tanaka, Los Angeles, CA (US);

Tatsuo Hashimoto, Akashi, JP;

Natsuki Ichimiya, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23B 27/14 (2006.01); C23C 30/00 (2006.01); C23C 14/32 (2006.01); C23C 28/04 (2006.01); C23C 14/06 (2006.01); C23C 28/00 (2006.01); B23F 21/00 (2006.01);
U.S. Cl.
CPC ...
B23B 27/14 (2013.01); C23C 14/0641 (2013.01); C23C 14/325 (2013.01); C23C 28/044 (2013.01); C23C 28/048 (2013.01); C23C 28/42 (2013.01); C23C 28/44 (2013.01); C23C 30/005 (2013.01); B23B 2228/08 (2013.01); B23B 2228/105 (2013.01); B23B 2228/36 (2013.01); B23F 21/00 (2013.01);
Abstract

At least a (AlCrSiCu)N (where 0.15≤a≤0.40, 0.05≤b≤0.20, and 0.005≤c≤0.05) layer is provided on a surface of a tool body, a Cr concentration or a Cu concentration periodically changes in a layer thickness direction, a concentration Crmax in a highest content point of Cr is in a range of a<Crmax≤1.3a, a concentration Crmin in a lowest content point of Cr is in a range of 0.50a≤Crmin<a, and optionally in a case where a Cu composition at one point z along the layer thickness direction is represented by cand a Cr composition at the point z is represented by a, (c/a)/(c/a) is 0.7 to 1.5 over the layer thickness direction entirely.


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