The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2020
Filed:
Dec. 29, 2018
Applicant:
Intel Ip Corporation, Santa Clara, CA (US);
Inventors:
Robert Pelt, Austin, TX (US);
Balatripura Chavali, Sugar Land, TX (US);
Assignee:
Intel IP Corporation, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/30 (2020.01); G06F 11/263 (2006.01); G06F 30/34 (2020.01); G06F 30/33 (2020.01); G06F 30/327 (2020.01); G06F 30/3323 (2020.01);
U.S. Cl.
CPC ...
G06F 30/34 (2020.01); G06F 11/263 (2013.01); G06F 30/327 (2020.01); G06F 30/33 (2020.01); G06F 30/3323 (2020.01);
Abstract
Methods and apparatus relating to diagnostic testing of FPGAs for safety critical systems are described. In an embodiment, logic circuitry (e.g., a processor) performs one or more diagnostic operations on a portion of a Field Programmable Gate Array (FPGA) based on one or more test vectors. Memory stores the one or more test vectors. The logic circuitry performs the one or more diagnostic operations on the portion of the FPGA during runtime. Other embodiments are also disclosed and claimed.