The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2020
Filed:
Jan. 16, 2018
General Electric Company, Schenectady, NY (US);
Huan Tan, Clifton Park, NY (US);
Ana Dasilva, Schenectady, NY (US);
Eric Gros, Waukesha, WI (US);
Romano Patrick, Niskayuna, NY (US);
Charles Theurer, Alplaus, NY (US);
Mauricio Castillo-Effen, Rexford, NY (US);
John Lizzi, Wilton, NY (US);
GENERAL ELECTRIC COMPANY, Schenectady, NY (US);
Abstract
Modifying a motion plan for an autonomously-operated inspection platform (AIP) includes obtaining sensor data for an industrial asset area of interest, analyzing the obtained sensor data during execution of an initial motion plan to determine if modification of the initial motion plan is required. If modification is required then performing a pose estimation on a first group of potential targets and a second group of potential targets, optimizing the results of the pose estimation to determine a modification to the initial motion plan, performing reactive planning to the initial motion plan to include the modification, the reactive planning providing a modified motion plan that includes a series of waypoints defining a modified path, and autonomously controlling motion of the AIP along the modified path. The analysis, pose estimation, optimization, and reactive planning occurring during movement of the AIP along a motion plan. A system and computer-readable medium are disclosed.