The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2020
Filed:
May. 23, 2017
Carl Zeiss Microscopy Gmbh, Jena, DE;
Alexander Gaiduk, Jena, DE;
Ralf Wolleschensky, Jena, DE;
CARL ZEISS MICROSCOPY GMBH, Jena, DE;
Abstract
The present invention relates to a digital microscope that includes an objective lens for enlarged optical imaging of a sample in an image plane. An image with an optical resolution may be represented in the image plane by means of the objective lens. The microscope also includes an image sensor for converting the image, depicted on the image sensor by the objective lens, into an electrical signal. The image sensor includes a matrix of pixels by means of which a maximum image resolution of the image sensor is determined, which is finer than the optical resolution of the objective lens. The objective lens has a maximum magnification factor of at most 40. The optical resolution of the objective lens is defined as a minimum distance between two structures that are distinguishable in the image. The maximum image resolution of the image sensor is defined by a pixel pitch. A quotient of the minimum distance between two structures that are distinguishable in the image and the pixel pitch defines a scanning factor that is at least 5.