The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2020
Filed:
Oct. 03, 2014
Applicant:
Hewlett-packard Development Company, L.p., Houston, TX (US);
Inventors:
Pol Fornos, Sant Cugat del Valles, ES;
Sergio Puigardeu Aramendia, Sant Cugat del Valles, ES;
David Ramirez Muela, Sant Cugat del Valles, ES;
Salvador Sanchez Ribes, Sant Cugat del Valles, ES;
Assignee:
Hewlett-Packard Development Company, L.P., Spring, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B29C 64/393 (2017.01); B29C 35/02 (2006.01); B33Y 30/00 (2015.01); B33Y 50/02 (2015.01); B29C 64/386 (2017.01); B29C 64/165 (2017.01); B33Y 10/00 (2015.01); B29C 64/264 (2017.01); B29C 64/10 (2017.01);
U.S. Cl.
CPC ...
B29C 64/393 (2017.08); B29C 35/0288 (2013.01); B29C 64/10 (2017.08); B29C 64/165 (2017.08); B29C 64/264 (2017.08); B29C 64/386 (2017.08); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); B33Y 50/02 (2014.12);
Abstract
A method of controlling temperature in an apparatus for generating a three-dimensional object comprises performing a calibration test on a sample of build material that is to be used in generating a three-dimensional object, calibrating at least one temperature point from the calibration test, and using the at least one calibrated temperature point during subsequent temperature control of the apparatus.