The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2020

Filed:

Sep. 28, 2018
Applicant:

Bae Systems Information and Electronic Systems Integration Inc., Nashua, NH (US);

Inventors:

David D Moser, Haymarket, VA (US);

Michael J. Frack, Reva, VA (US);

Jason F. Ross, Haymarket, VA (US);

Kevin Linger, Arlington, VA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G11C 8/00 (2006.01); G11C 29/32 (2006.01); G11C 7/22 (2006.01); G11C 7/10 (2006.01);
U.S. Cl.
CPC ...
G11C 29/32 (2013.01); G11C 7/106 (2013.01); G11C 7/1087 (2013.01); G11C 7/222 (2013.01); G11C 2029/3202 (2013.01);
Abstract

A scannable-latch random access memory (SLRAM) is disclosed. The SLRAM includes two rows of memory cells. The SLRAM includes a functional data input, a scan data input, a first and second functional data outputs, a scan data output, and a scan enable. The functional data input is connected to a first memory cell in a first and second rows of memory cells. The scan data input is connected to the first memory cell in the first or second row of memory cells. The first and second functional data outputs are connected to a last memory cell in the first and second row of memory cells, respectively. The scan data output is connected to the last memory cell in the first or second row of memory cells. The scan enable allows data to be output from the scan data output or the first and second functional data outputs.


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