The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2020

Filed:

Jul. 08, 2014
Applicant:

Carl Zeiss Microscopy Gmbh, Jena, DE;

Inventors:

Jörg Siebenmorgen, Jena, DE;

Thomas Kalkbrenner, Jena, DE;

Helmut Lippert, Jena, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 27/00 (2006.01); G02B 21/16 (2006.01); G02B 21/36 (2006.01); G02B 21/00 (2006.01); G02B 21/34 (2006.01); G01N 21/15 (2006.01); G02B 21/02 (2006.01); G02B 21/33 (2006.01); G01N 21/03 (2006.01);
U.S. Cl.
CPC ...
G02B 27/0025 (2013.01); G01N 21/15 (2013.01); G02B 21/0032 (2013.01); G02B 21/0076 (2013.01); G02B 21/0088 (2013.01); G02B 21/02 (2013.01); G02B 21/16 (2013.01); G02B 21/33 (2013.01); G02B 21/34 (2013.01); G02B 21/367 (2013.01); G02B 27/0068 (2013.01); G01N 2021/0396 (2013.01);
Abstract

An arrangement, for light sheet microscopy, including: a sample vessel, for receiving a medium containing a sample, oriented with respect to a plane reference surface; illumination optics with an illumination objective for illuminating the sample with a light sheet; and detection optics with a detection objective. The optical axis of the illumination objective and the light sheet lies in a plane which forms a nonzero illumination angle with the normal of the reference surface. The detection objective has an optical axis that forms a nonzero detection angle with the normal of the reference surface. The arrangement also includes a separating-layer system for separating the sample-containing medium from the illumination and detection objectives. The separating-layer system contacts the medium with an interface parallel to the reference surface. The illumination angle and detection angle are predetermined based on numerical apertures of the detection objective and of the illumination objective, respectively.


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