The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2020
Filed:
Nov. 14, 2018
Applicant:
Jeol Ltd., Tokyo, JP;
Inventor:
Tomoki Nakao, Tokyo, JP;
Assignee:
JEOL Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/46 (2006.01);
U.S. Cl.
CPC ...
G01R 33/4625 (2013.01);
Abstract
A baseline component in an NMR spectrum (observed spectrum) is expressed as a sparse signal in a time space. In a nonlinear fitting under a condition of minimizing an Lp norm (wherein p≤1), the Lp norm functions to emphasize the sparsity of a norm computation target. Using these two properties, an optimum solution of a coefficient vector to be given to a computed vector is searched to minimize the Lp norm for a residual vector in the time space corresponding to a residual spectrum.
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Nakao, Tomoki. (2020). Apparatus and method for analyzing spectrum (U.S. Patent No. 10712414). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10712414
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