The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2020

Filed:

Aug. 31, 2016
Applicant:

Mitsubishi Materials Corporation, Tokyo, JP;

Inventors:

Sho Tatsuoka, Naka, JP;

Kenichi Sato, Naka, JP;

Kenji Yamaguchi, Naka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23B 27/14 (2006.01); C23C 16/34 (2006.01); C23C 16/36 (2006.01); C23C 28/04 (2006.01); C23C 16/455 (2006.01); C23C 28/00 (2006.01);
U.S. Cl.
CPC ...
B23B 27/148 (2013.01); C23C 16/34 (2013.01); C23C 16/36 (2013.01); C23C 16/45523 (2013.01); C23C 28/00 (2013.01); C23C 28/042 (2013.01); C23C 28/044 (2013.01);
Abstract

The hard coating layer of the cutting tool includes a complex nitride or complex carbonitride layer expressed by the composition formula: (TiAl)(CN). xand ysatisfy 0.60≤x≤0.95 and 0≤y≤0.005. xis an average content ratio of Al in a total amount of Ti and Al, and yis an average content ratio of C in a total amount of C and N. Some crystal grains composing the complex nitride or complex carbonitride layer have a cubic structure. In crystal grains having the cubic structure, the average crystal grain misorientaion is 1 degree or more; or 2 degrees or more, based on analysis of the polished surface perpendicular to a surface of the layer. A peak exists in 1-2 degrees of the average crystal grain misorientation in the frequency distribution of the average crystal grain misorientation and the area ratio.


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