The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2020
Filed:
Feb. 09, 2017
Applicant:
Micron Technology, Inc., Boise, ID (US);
Inventors:
David Boles, Austin, TX (US);
John M. Groves, Austin, TX (US);
Steven Moyer, Round Rock, TX (US);
Alexander Tomlinson, Austin, TX (US);
Assignee:
Micron Technology, Inc., Boise, ID (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 16/901 (2019.01);
U.S. Cl.
CPC ...
G06F 16/9027 (2019.01);
Abstract
Systems and techniques for collecting and using merge tree garbage metrics are described herein. A kvset is created for a node in a KVS tree. Here, a set of kvset metrics for the kvset are computed as part of the node creation. The kvset is added to the node. The node is selected for a compaction operation based on a metric in the set of kvset metrics. The compaction operation is performed on the node.