The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2020

Filed:

Jul. 20, 2018
Applicant:

Koh Young Technology Inc., Seoul, KR;

Inventors:

Hyun-Seok Lee, Suwon-si, KR;

Jae-Sik Yang, Incheon, KR;

Ja-Geun Kim, Seoul, KR;

Hee-Tae Kim, Yongin-si, KR;

Hee-Wook You, Anyang-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01N 21/94 (2006.01); G01N 21/88 (2006.01); G06T 7/00 (2017.01); G06T 11/60 (2006.01); G01N 21/956 (2006.01);
U.S. Cl.
CPC ...
G01N 21/94 (2013.01); G01N 21/8806 (2013.01); G06T 7/001 (2013.01); G06T 11/60 (2013.01); G01N 2021/8845 (2013.01); G01N 2021/95638 (2013.01); G01N 2201/061 (2013.01); G01N 2201/13 (2013.01); G06T 2207/10004 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/30141 (2013.01);
Abstract

In order to inspect a substrate, an image information of a substrate before applying solder is displayed. Then, at least one inspection region on the substrate is image-captured to obtain an image of the inspection region that is image-captured. Then, image information that is to be displayed is renewed and the renewed image information is displayed. And, in order to inspect a foreign substance, obtained image of the inspection region is compared with a reference image of the substrate. Therefore, an operator can easily catch a region corresponding to a specific region of the image that is displayed, and easily detect a foreign substance on the substrate.


Find Patent Forward Citations

Loading…