The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2020

Filed:

Aug. 23, 2017
Applicant:

Commissariat a L'energie Atomique ET Aux Energies Alternatives, Paris, FR;

Inventors:

Vincent Reboud, Paris, FR;

Jean-Michel Hartmann, Montbonnot-Saint-Martin, FR;

Alexei Tchelnokov, Meylan, FR;

Vincent Calvo, Fontaine, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/02 (2006.01); H01L 21/28 (2006.01); H01L 29/78 (2006.01); H01L 33/00 (2010.01);
U.S. Cl.
CPC ...
H01L 21/02384 (2013.01); H01L 21/0223 (2013.01); H01L 21/02236 (2013.01); H01L 21/02373 (2013.01); H01L 21/02381 (2013.01); H01L 21/02524 (2013.01); H01L 21/02532 (2013.01); H01L 21/02535 (2013.01); H01L 21/02664 (2013.01); H01L 21/28229 (2013.01); H01L 21/28238 (2013.01); H01L 29/7842 (2013.01); H01L 29/7847 (2013.01); H01L 33/005 (2013.01);
Abstract

The invention pertains to a process for producing a strained layer based on germanium-tin (GeSn). The process includes a step of producing a semiconductor stack containing a layer based on GeSn and having an initial strain value that is non-zero; a step of structuring the semiconductor stack so as to form a structured portion and a peripheral portion, the structured portion including a central section linked to the peripheral portion by at least two lateral sections having an average width greater than an average width of the central section; and a step of suspending the structured portion, the central section then having a final strain value higher than the initial value.


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