The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2020
Filed:
Mar. 15, 2016
Hitachi, Ltd., Chiyoda-ku, Tokyo, JP;
Norihiko Nonaka, Tokyo, JP;
Yixiang Feng, Tokyo, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
Provided is a technology capable of detecting analysis accuracy and an analysis time of an analysis object system appropriately and objectively. A whole integrated analysis model assist device according to the present invention calculates an analysis prediction time and an analysis prediction accuracy when whole integrated analysis for an analysis object is performed using acquired analysis results corresponding to a plurality of analysis levels of detail of a plurality of components, and outputs the analysis prediction time and the analysis prediction accuracy corresponding to a designated combination of the analysis levels of detail of the plurality of components.