The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2020
Filed:
Jan. 25, 2017
Cadence Design Systems, Inc., San Jose, CA (US);
Meir Ovadia, Rosh Ha-Ayin, IL;
CADENCE DESIGN SYSTEMS, INC., San Jose, CA (US);
Abstract
A method for debugging a system on chip (SoC) under test, may include automatically inserting commands in a test code for testing the SoC for invoking printing of messages of data, each message of the messages including start time, end time of each executed action of a plurality of actions, the executed action to be invoked by the test code when testing the SoC, the data further including identity of a processing component of a plurality of processing components of the SoC, on which the executed action was executed; recording the data of the invoked printed messages during testing of the test code on the SoC; and displaying, via a graphical user interface, one or a plurality of graphical representations, each of said graphical representations relating to a period of activity of one of the plurality of processing components over time, based on the recorded data.