The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2020

Filed:

Jun. 26, 2013
Applicant:

Carl Zeiss Microscopy Gmbh, Jena, DE;

Inventors:

Wolfgang Singer, Aalen, DE;

Jorg Siebenmorgen, Jena, DE;

Tiemo Anhut, Jena, DE;

Ralf Wolleschensky, Jena, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/16 (2006.01); G02B 21/00 (2006.01); G02B 21/36 (2006.01); G02B 21/06 (2006.01); G02B 27/09 (2006.01);
U.S. Cl.
CPC ...
G02B 27/0927 (2013.01); G02B 21/0032 (2013.01); G02B 21/0076 (2013.01); G02B 21/06 (2013.01); G02B 21/16 (2013.01); G02B 21/361 (2013.01); G02B 21/367 (2013.01); G02B 27/0988 (2013.01);
Abstract

A microscope, in particular according to any of the preceding claims, consisting of an illuminating device, comprising an illumination light source and an illumination beam path for illuminating the specimen with a light sheet, a detection device for detecting light emitted by the specimen, and an imaging optical unit, which images the specimen via an imaging objective in an imaging beam path at least partly onto the detection device, wherein the light sheet is essentially planar at the focus of the imaging objective or in a defined plane in proximity of the geometrical focus of the imaging objective, and wherein the imaging objective has an optical axis, which intersects the plane of the light sheet at an angle that is different from zero, preferably perpendicularly, wherein an amplitude and/or phase filter is provided in the illumination beam path, said filter acting as a sine spatial filter in that it limits the illumination light in at least one spatial direction by filtering the spatial frequencies that occur with a sine function and/or in that the illumination light is limited with regard to the phase and amplitude thereof in at least one spatial direction by a sine filter function, and/or a combined amplitude and phase filter is provided in the illumination beam path, said filter shaping the light sheet by influencing the transmission profile of the illumination light distribution with a sine filter function.


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