The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2020

Filed:

Jan. 17, 2018
Applicant:

Mitutoyo Corporation, Kanagawa, JP;

Inventor:

Takashi Noda, Tochigi, JP;

Assignee:

MITUTOYO CORPORATION, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/008 (2006.01); G01B 5/016 (2006.01); G01B 5/012 (2006.01); G01B 5/20 (2006.01); G01B 21/04 (2006.01);
U.S. Cl.
CPC ...
G01B 5/016 (2013.01); G01B 5/008 (2013.01); G01B 5/012 (2013.01); G01B 5/20 (2013.01); G01B 21/047 (2013.01); G01B 21/045 (2013.01);
Abstract

A shape measuring apparatus includes a probe head that changes its posture by rotational motion of a first drive axis and a second drive axis, and a coordinate measuring machine that three-dimensionally displaces a location of the probe head by three translation axes (a third drive axis, a fourth drive axis, and a fifth drive axis). The location of a measurement tip is given by coordinate values of the third to fifth drive axes, and the posture of a probe head is given by a first rotating angle α and a second rotating angle β. An intersection point between a first rotation axis and a second rotation axis is set as a rotation center Q. An interpolation point in each control period is calculated for each of the first to fifth drive axes.


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