The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2020

Filed:

Sep. 29, 2017
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Rita Chattopadhyay, Chandler, AZ (US);

Mruthunjaya Chetty, Beaverton, OR (US);

Jeffrey Davis, Gilbert, AZ (US);

Stephanie Cope, Tempe, AZ (US);

Xiaozhong Ji, Phoenix, AZ (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B25J 9/16 (2006.01); G01N 19/08 (2006.01); G06Q 10/06 (2012.01); G05B 19/418 (2006.01); G05B 23/02 (2006.01);
U.S. Cl.
CPC ...
B25J 9/1674 (2013.01); B25J 9/1602 (2013.01); G01N 19/08 (2013.01); G05B 19/418 (2013.01); G05B 23/024 (2013.01); G05B 23/0272 (2013.01); G06Q 10/0639 (2013.01); G05B 2219/37434 (2013.01);
Abstract

Methods, apparatus, systems, and articles of manufacture for monitoring robot health in manufacturing environments are described herein. An example system, to monitor health of a robot in a semiconductor wafer manufacturing facility, includes a sensor coupled to the robot. The sensor is to obtain a vibration signal representative of vibration of the robot. The example system also includes a health monitor extract a feature from the vibration signal, compare the feature to a threshold, and, in response to determining the feature satisfies the threshold, transmit an alert.


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