The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2020

Filed:

Dec. 21, 2018
Applicants:

Galen Gledhill, Hillsboro, OR (US);

Mostafa Maazouz, Hillsboro, OR (US);

Inventors:

Galen Gledhill, Hillsboro, OR (US);

Mostafa Maazouz, Hillsboro, OR (US);

Assignee:

FEI Company, Hillsboro, OR (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/00 (2006.01); H01J 37/295 (2006.01); G02B 21/00 (2006.01); H01J 37/147 (2006.01); H01J 37/12 (2006.01);
U.S. Cl.
CPC ...
H01J 37/2955 (2013.01); G02B 21/0048 (2013.01); G02B 21/0052 (2013.01); H01J 37/12 (2013.01); H01J 37/1477 (2013.01);
Abstract

Apparatus include a reflector positioned adjacent to a sample location that is situated to receive a charged particle beam (CPB) along a CPB axis from a CPB focusing assembly so that the reflector is situated to receive light emitted from a sample at the sample location based on a CPB-sample interaction or a photon-sample interaction and to direct the light to a photodetector, and a steering electrode situated adjacent to the reflector so as to direct secondary charged particles emitted from the sample based on the CPB-sample interaction away from the reflector and CPB axis. Methods and systems are also disclosed.


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