The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 2020
Filed:
Jul. 04, 2017
Applicant:
Kandou Labs, S.a., Lausanne, CH;
Inventors:
Roger Ulrich, Bern, CH;
Armin Tajalli, Chavannes près Renens, CH;
Ali Hormati, Ecublens, CH;
Richard Simpson, Bedford, GB;
Assignee:
KANDOU LABS, S.A., Lausanne, CH;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 7/00 (2006.01); H04L 25/14 (2006.01); H04L 7/033 (2006.01); H04L 25/49 (2006.01); H04L 25/03 (2006.01);
U.S. Cl.
CPC ...
H04L 7/0016 (2013.01); H04L 7/0054 (2013.01); H04L 7/0079 (2013.01); H04L 7/033 (2013.01); H04L 25/03 (2013.01); H04L 25/03057 (2013.01); H04L 25/14 (2013.01); H04L 25/49 (2013.01); H04L 25/4904 (2013.01); H04L 7/0025 (2013.01); H04L 25/03878 (2013.01); H04L 2025/03356 (2013.01);
Abstract
Generating, during a first and second signaling interval, an aggregated data signal by forming a linear combination of wire signals received in parallel from wires of a multi-wire bus, wherein at least some of the wire signals undergo a signal level transition during the first and second signaling interval; measuring a signal skew characteristic of the aggregated data signal; and, generating wire-specific skew offset metrics, each wire-specific skew offset metric based on the signal skew characteristic.