The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 2020
Filed:
Jan. 16, 2017
Applicant:
Fei Company, Hillsboro, OR (US);
Inventors:
Wilfred Kelsham Fullagar, Weetangera, AU;
Andrew Maurice Kingston, Kambah, AU;
Glenn Robert Myers, Waramanga, AU;
Mahsa Paziresh, Acton, AU;
Trond Karsten Varslot, Vuku, NO;
Assignee:
FEI Company, Hillsboro, OR (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/00 (2006.01); G21K 7/00 (2006.01); G01N 23/046 (2018.01); G01N 23/2252 (2018.01);
U.S. Cl.
CPC ...
G21K 7/00 (2013.01); G01N 23/046 (2013.01); G01N 23/2252 (2013.01); H01J 2237/2807 (2013.01);
Abstract
A method of analyzing a specimen using X-rays, comprising the steps of: