The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2020
Filed:
Mar. 01, 2018
Applicant:
Samsung Display Co., Ltd., Yongin-si, Gyeonggi-do, KR;
Inventors:
Yiwei Zhang, San Jose, CA (US);
Janghwan Lee, Pleasanton, CA (US);
Assignee:
Samsung Display Co., Ltd., Yongin-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 3/00 (2006.01); H04N 17/04 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
H04N 17/04 (2013.01); G06T 7/0004 (2013.01); G09G 3/006 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/30121 (2013.01); G09G 2320/0233 (2013.01); G09G 2360/145 (2013.01);
Abstract
A system and method for white spot Mura defects on a display. The system is configured to pre-process an input images to generate a plurality of image patches. A feature vector is then extracted for each of the plurality of image patches. The feature vector includes at least one image moment feature and at least one texture feature. A machine learning classifier then determines the presence of a defect in each patch using the feature vector.