The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2020

Filed:

Sep. 17, 2018
Applicant:

Western Digital Technologies, Inc., San Jose, CA (US);

Inventors:

Sahil Sharma, San Jose, CA (US);

Nian Yang, Mountain View, CA (US);

Philip David Reusswig, Mountain View, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 16/26 (2006.01); G11C 16/04 (2006.01); G11C 16/14 (2006.01); G11C 16/10 (2006.01); G11C 11/56 (2006.01); G11C 16/34 (2006.01);
U.S. Cl.
CPC ...
G11C 16/26 (2013.01); G11C 11/5628 (2013.01); G11C 11/5635 (2013.01); G11C 11/5642 (2013.01); G11C 11/5671 (2013.01); G11C 16/0483 (2013.01); G11C 16/10 (2013.01); G11C 16/14 (2013.01); G11C 16/3495 (2013.01); G11C 16/3459 (2013.01);
Abstract

Disclosed are systems and methods for providing pre-program read to counter wordline failures. A method includes performing a read operation on a first portion of a flash memory in response to an erase operation on a second portion of the flash memory, wherein the first portion comprises a plurality of logical wordlines corresponding to a plurality of physical wordlines of the second portion. The method also includes counting, for each of the plurality of logical wordlines, a number of memory cells exceeding a threshold error voltage and marking defective physical wordlines in a bitmap. The method also includes performing a write operation into a third portion of the flash memory that includes at least one physical wordline marked as defective in the error bitmap, wherein a predetermined data pattern is written to a lower page of the at least one physical wordline.


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