The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2020
Filed:
Sep. 30, 2016
Emc Ip Holding Company Llc, Hopkinton, MA (US);
Mark Opperman, Paris, FR;
Ryan Montgomery, Wake Forest, NC (US);
Eric Schnegelberger, Youngsville, NC (US);
EMC IP HOLDING COMPANY LLC, Hopkinton, MA (US);
Abstract
Case analysis is provided in which costs are associated with case information such as service request data. A description of defect classifications may be defined using keywords and attributes. A database query is generated based on the description of defect classifications to classify case information by problem type to a domain and a component. The description of defect classifications may be applied to a result of the database query to perform problem classification analysis. A cost analysis may be performed by problem group based at least on the case information associated with cost information and the result of the database SQL query.