The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2020
Filed:
Dec. 21, 2018
Micron Technology, Inc., Boise, ID (US);
Douglas Majerus, Boise, ID (US);
Brent Byron, Boise, ID (US);
Micron Technology, Inc., Boise, ID (US);
Abstract
Described herein are embodiments related to holdup self-tests in memory sub-systems for power loss operations. A processing device receives a request to perform a holdup self-test to detect a defect in a holdup circuit that powers the processing device and a memory component in the event of power loss. The processing device identifies a memory location of memory that is available and, responsive to detection of a loss of power, performs a continuous sequence of write operations to the memory location using holdup energy until all of the holdup energy is expended. After reboot, the processing device determines a number of the write operations that were successfully completed in the memory location before all of the holdup energy was expended. The processing device determines whether the number satisfies a defect criterion. Responsive to the responsive to the number satisfying the defect criterion, the processing device reports the defect associated with the holdup circuit.