The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2020
Filed:
May. 26, 2017
Applicant:
Advantest Corporation, Tokyo, JP;
Inventors:
Leon Chen, San Jose, CA (US);
Rebecca Toy, San Jose, CA (US);
Assignee:
ADVANTEST CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G11C 29/56 (2006.01); G01R 1/04 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2877 (2013.01); G11C 29/56016 (2013.01); G01R 1/0458 (2013.01); G01R 31/2891 (2013.01); G11C 29/56 (2013.01);
Abstract
New cooling control techniques suitable for use in the testing of devices are disclosed. The new cooling control techniques are an improvement over existing cooling control techniques because the new cooling control techniques utilize inputs that are more representative of actual thermal conditions experienced by a DUT (device under test) and/or are more representative of various other parameters, such as DUT power consumption/dissipation, during testing. Also, the new cooling control techniques offer flexibility with respect to the cooling control algorithm to employ for the DUT during testing.