The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2020
Filed:
Jun. 08, 2018
Applicant:
Teradyne, Inc., North Reading, MA (US);
Inventors:
Mohamadreza Ray Mirkhani, Porter Ranch, CA (US);
Kevin P. Manning, Thousand Oaks, CA (US);
Roya Yaghmai, Westlake Village, CA (US);
Timothy Lee Farris, Moorpark, CA (US);
Frank Parrish, Simi Valley, CA (US);
Assignee:
Teradyne, Inc., North Reading, unknown;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/073 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 1/07378 (2013.01); G01R 31/2834 (2013.01);
Abstract
An example test system has resources that are distributed for access by a device under test (DUT). The example test system includes a device interface board (DIB) having sites to connect to devices to test, and a tester having slots configured to hold test instruments. Each test instrument has resources that are distributed over a dimension of the DIB. The resources are distributed to enable the devices in the sites equal access to the resources.