The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2020
Filed:
Mar. 04, 2016
Intel Corporation, Santa Clara, CA (US);
Yael Yanai, Jerusalem, IL;
Yehiel Shilo, Jerusalem, IL;
Eli Kupermann, Maale Adumim, IL;
Chen-Hsun Wu, Taipei, TW;
Elena Agranovsky, Jerusalem, IL;
Marlon D. Bada, Mabalacat, PH;
Intel Corporation, Santa Clara, CA (US);
Abstract
Embodiments of the present disclosure provide techniques for sensor testing for computing devices during initial movement of the device, such as movement on a manufacturing line. In one instance, a device with integral sensor testing during initial movement of the device may include a plurality of sensors and a sensor test block coupled with the plurality of sensors, to detect, collect and/or report readings provided by at least some of the sensors in response to movement of the device between at least a first test station and a second test station. Other embodiments may be described and/or claimed.