The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2020
Filed:
Dec. 07, 2018
Kandou Labs, S.a., Lausanne, CH;
Richard Simpson, Bedford, GB;
KANDOU LABS, S.A., Lausanne, CH;
Abstract
Methods and systems are described for obtaining a plurality of BER-specific correction values by comparing a first set of BER values obtained by sampling, at a sampling instant near the center of a signaling interval, a non-DFE corrected received signal with a second set of BER values obtained by sampling a DFE-corrected received signal at the sampling instant. A set of eye-scope BER measurements are obtained, each eye-scope BER measurement having a sampling offset relative to the sampling instant, a voltage offset value representing a voltage offset applied to alter a decision threshold, and an eye-scope BER value. A set of DFE-adjusted eye-scope BER measurements are generated by using BER-specific correction values to adjust the voltage offset values of the eye-scope BER measurements.