The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2020

Filed:

Jan. 10, 2019
Applicant:

Varian Semiconductor Equipment Associates, Inc., Gloucester, MA (US);

Inventors:

Craig R. Chaney, Gloucester, MA (US);

Adam M. McLaughlin, Merrimac, MA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/67 (2006.01); C23C 14/48 (2006.01); G08B 21/18 (2006.01); H01J 37/317 (2006.01); H01J 37/16 (2006.01); B33Y 80/00 (2015.01);
U.S. Cl.
CPC ...
H01L 21/67294 (2013.01); C23C 14/48 (2013.01); G08B 21/18 (2013.01); H01J 37/16 (2013.01); H01J 37/3171 (2013.01); H01L 21/67213 (2013.01); H01L 21/67288 (2013.01); B33Y 80/00 (2014.12); H01J 2237/2482 (2013.01);
Abstract

The present disclosure describes a method and apparatus for determining whether components in a semiconductor manufacturing system are authorized for use in that system. By embedding an identification feature in the component, it is possible for a controller to determine whether that component is qualified for use in the system. Upon detection of an unauthorized component, the system may alert the user or, in certain embodiments, stop operating of the system. This identification feature is embedded in a component by using an additive manufacturing process that allows the identification feature to be embedded in the component without subjecting the identification feature to extreme temperatures.


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