The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2020

Filed:

Sep. 01, 2017
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-Do, KR;

Inventors:

Sang-Uhn Cha, Yongin-si, KR;

Ye-Sin Ryu, Seoul, KR;

Assignee:

SAMSUNG ELECTRONICS CO., LTD., Suwon-si, Gyeonggi-Do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/10 (2006.01); G11C 29/42 (2006.01); G06F 11/07 (2006.01); G11C 29/44 (2006.01); G06F 3/06 (2006.01); G11C 29/52 (2006.01); G11C 13/00 (2006.01); G06F 12/02 (2006.01);
U.S. Cl.
CPC ...
G06F 11/106 (2013.01); G06F 11/1016 (2013.01); G06F 3/0619 (2013.01); G06F 11/076 (2013.01); G06F 11/0751 (2013.01); G06F 11/0772 (2013.01); G06F 11/1068 (2013.01); G06F 11/1072 (2013.01); G06F 12/0246 (2013.01); G06F 2211/1088 (2013.01); G11C 13/0033 (2013.01); G11C 29/42 (2013.01); G11C 29/44 (2013.01); G11C 29/52 (2013.01);
Abstract

A scrubbing controller of a semiconductor memory device includes a scrubbing address generator and a weak codeword address generator. The scrubbing address generator generates a scrubbing address for all codewords in a first bank array of a plurality of bank arrays in a first scrubbing mode. The scrubbing address is associated with a normal scrubbing operation and changes in response to an internal scrubbing signal and a scrubbing command. The weak codeword address generator generates a weak codeword address for weak codewords in the first bank array in a second scrubbing mode. The weak codeword address is associated with a weak scrubbing operation and is generated in response to the internal scrubbing signal.


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