The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2020
Filed:
Apr. 13, 2018
Applicant:
Tektronix, Inc., Beaverton, OR (US);
Inventors:
David A. Holaday, Cornelius, OR (US);
Joshua J. O'Brien, Aloha, OR (US);
Assignee:
Tektronix, Inc., Beaverton, OR (US);
Primary Examiner:
Int. Cl.
CPC ...
G01R 13/02 (2006.01); G01R 13/20 (2006.01); G11C 29/56 (2006.01); G01R 13/34 (2006.01); G11C 29/52 (2006.01); G11C 27/02 (2006.01);
U.S. Cl.
CPC ...
G01R 13/0254 (2013.01); G01R 13/02 (2013.01); G01R 13/0272 (2013.01); G01R 13/20 (2013.01); G01R 13/34 (2013.01); G01R 13/345 (2013.01); G11C 29/56 (2013.01); G11C 27/02 (2013.01); G11C 29/52 (2013.01);
Abstract
A test and measurement instrument can include an input to receive an analog signal, a sampler to produce digital sample data corresponding to the analog signal, a buffer to store a portion of the sample data, a memory to store sample data from the buffer, a plurality of comparators to establish a vertical range, and a controller configured to configure the plurality of comparators to establish a first vertical range based on sample data in the buffer, and determine whether any of the sample data in the buffer transitions outside the first vertical range during a period of time.