The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2020
Filed:
Apr. 19, 2016
Intel Corporation, Santa Clara, CA (US);
Tolga Acikalin, San Jose, CA (US);
Shengbo Xu, Newark, CA (US);
Melissa A. Cowan, Hillsboro, OR (US);
INTEL CORPORATION, Santa Clara, CA (US);
Abstract
Techniques are disclosed for particulate matter (PM) measurement in a medium (such as air) using flat-top intensity laser sheet beam generation. The techniques for generating the laser sheet beam may include nonspecialized optical elements (e.g., aspherical, spherical, biconvex, and/or cylindrical lenses) that are cost-effective, reduce the overall footprint of the system, and also provide for relatively increased power efficiencies compared to conventional techniques. The PM measurement system may use the laser sheet beam generated in combination with a medium flow channel to pass the medium through the laser sheet beam, thereby causing particulates within the medium to scatter light, which can be detected using a light sensor (e.g., a photodetector). The scattered light signals can then be analyzed to match them with corresponding particulate sizes and the amount of signals per particulate size can also be determined to measure the size and count of particulates within the medium.