The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2020
Filed:
Mar. 23, 2018
Mitutoyo Corporation, Kanagawa, JP;
Fumihiko Koshimizu, Kanagawa, JP;
Koji Shinza, Kanagawa, JP;
MITUTOYO CORPORATION, Kanagawa, JP;
Abstract
A hardness tester includes an image acquirer acquiring an image of a surface of a sample captured by an image capturer, a test area definer defining a test area where the hardness test is performed with respect to the image of the surface of the sample displayed by a display which displays the acquired image of the surface, a test setting acquirer acquiring estimated hardness of the sample and test force when the hardness test is performed, an estimator estimating a size of the indentation to be formed on the surface of the sample based on the acquired test force and the estimated hardness, and a display controller displaying an image picture of the indentation to be formed, based on the estimated size of the indentation superimposed on the image of the surface of the sample displayed by the display.