The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2020

Filed:

Jul. 09, 2014
Applicants:

Jiangwen Deng, Kwai Chung, HK;

Wui Fung Sze, Kwai Chung, HK;

Qi Lang, Kwai Chung, HK;

Inventors:

Jiangwen Deng, Kwai Chung, HK;

Wui Fung Sze, Kwai Chung, HK;

Qi Lang, Kwai Chung, HK;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/235 (2006.01); G01B 11/25 (2006.01); G06T 7/521 (2017.01);
U.S. Cl.
CPC ...
H04N 5/2354 (2013.01); G01B 11/25 (2013.01); G06T 7/521 (2017.01);
Abstract

Disclosed is an apparatus for reconstructing a three-dimensional profile of a target surface of an object. The apparatus comprises: i) a lighting apparatus having at least two modes of illumination to illuminate the target surface, wherein a first mode of illumination produces a pattern onto the target surface and a second mode of illumination illuminates every part of the target surface; ii) an imaging device for capturing respective images of the target surface upon a sequential activation of the first and second modes of illumination of the target surface by the lighting apparatus; and iii) a processor for reconstructing the three-dimensional profile of the target surface based on the images of the target surface as captured by the imaging device. A method of reconstructing a 3D profile of a target surface of an object is also disclosed.


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