The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2020

Filed:

Feb. 15, 2017
Applicant:

Globalfoundries Inc., Grand Cayman, KY;

Inventors:

Dominic J. Schepis, Wappingers Falls, NY (US);

Alexander Reznicek, Troy, NY (US);

Assignee:

GLOBALFOUNDRIES INC., Grand Cayman, KY;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 29/66 (2006.01); H01L 29/786 (2006.01); H01L 29/423 (2006.01); H01L 29/78 (2006.01); H01L 29/06 (2006.01); H01L 29/51 (2006.01); H01L 29/49 (2006.01);
U.S. Cl.
CPC ...
H01L 29/66742 (2013.01); H01L 29/0676 (2013.01); H01L 29/42392 (2013.01); H01L 29/4908 (2013.01); H01L 29/517 (2013.01); H01L 29/7827 (2013.01); H01L 29/78642 (2013.01);
Abstract

Devices and methods of fabricating vertical nanowires on semiconductor devices are provided. One method includes: obtaining an intermediate semiconductor device having a substrate, a first insulator disposed above the substrate, a material layer over the first insulator, a second insulator above the material layer, and a first hardmask; etching a plurality of vertical trenches through the hardmask, the first and second insulators, and the material layer; growing, epitaxially, a set of silicon nanowires from a bottom surface of the plurality of vertical trenches; etching a first set of vertical trenches to expose the material layer; etching a second set of vertical trenches to the substrate; depositing an insulating spacer material on a set of sidewalls of the first and second set of vertical trenches; and forming contacts in the first and second set of vertical trenches.


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