The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2020

Filed:

Dec. 27, 2016
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Rita H. Wouhaybi, Portland, OR (US);

Bradford H. Needham, North Plains, OR (US);

Igor Tatourian, Santa Clara, CA (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 18/00 (2006.01); H04L 29/08 (2006.01); H04L 12/66 (2006.01);
U.S. Cl.
CPC ...
H04L 67/12 (2013.01); G01D 18/00 (2013.01); H04L 67/1097 (2013.01); H04L 12/66 (2013.01); Y04S 40/18 (2018.05);
Abstract

Systems and methods for sensor normalization are described. An example of a method includes receiving a first value of a characteristic measured by a first sensor of a first sensor type, and receiving a second value of the characteristic measured by a second sensor of a second sensor type that is more accurate than the first sensor type. A normalization for the first sensor is determined based on the first value and the second value, wherein the normalization alters a response equation of the first sensor. Normalizing another sensor of a same time as the first sensor, based, at least in part, on the normalization.


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