The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2020

Filed:

Sep. 21, 2018
Applicant:

Nanya Technology Corporation, New Taipei, TW;

Inventor:

Chung-Lin Huang, Taoyuan, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/768 (2006.01); H01L 23/532 (2006.01); H01L 21/285 (2006.01); H01L 27/108 (2006.01);
U.S. Cl.
CPC ...
H01L 21/7684 (2013.01); H01L 21/28556 (2013.01); H01L 21/76801 (2013.01); H01L 21/76847 (2013.01); H01L 21/76877 (2013.01); H01L 23/5329 (2013.01); H01L 23/53266 (2013.01); H01L 27/108 (2013.01);
Abstract

The present disclosure provides a semiconductor structure and a method for manufacturing the semiconductor structure. The semiconductor structure includes a semiconductor substrate, a dielectric layer, a barrier layer, and a conductive layer. The semiconductor substrate has a plurality of mesas. The dielectric layer is disposed over the semiconductor substrate and has a plurality of blocks disposed over the mesas, respectively. The barrier layer is formed over a first lateral surface of the mesa, a second lateral surface of the block, an upper surface of the semiconductor substrate adjacent to the first lateral surface, and a front surface of the dielectric layer adjacent to the second lateral surface. The conductive layer has a base and a plurality of protrusions extending from the base and in contact with the barrier layer disposed over the upper surface, the first lateral surface, and the second lateral surface. A grain size of the base and the protrusions is consistent.


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