The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2020

Filed:

Dec. 28, 2016
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Hartvig Ekner, Holte, DK;

Dines Justesen, Vanløse, DK;

Daniel A. Temple, Herlev, DK;

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/14 (2006.01);
U.S. Cl.
CPC ...
G06F 1/14 (2013.01);
Abstract

One embodiment relates to a method of performing a latency measurement within an integrated circuit. Receipt of a word that contains a beginning of a frame is detected by a frame begin detect circuit in a decoding circuit block. A begin frame detected signal is fed back to the physical media attachment circuit, and an asynchronous signal from the physical media attachment circuit is transmitted at a beginning of a subsequent frame to a time measurement circuit in a core of the integrated circuit. A bitcount may be used to generate a synchronous signal that is also transmitted to the core. At the core of the integrated circuit, a first time is measured that corresponds to receipt of the asynchronous signal and a second time is measured that corresponds to receipt of the synchronous signal. A latency is determined at least by subtracting the first time subtracted from the second time. Other embodiments and features are also disclosed.


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