The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2020
Filed:
Feb. 27, 2018
Applicant:
Aehr Test Systems, Fremont, CA (US);
Inventors:
Jovan Jovanovic, Santa Clara, CA (US);
Kenneth W. Deboe, Santa Clara, CA (US);
Steven C. Steps, Saratoga, CA (US);
Scott E. Lindsey, Brentwood, CA (US);
Assignee:
AEHR TEST SYSTEMS, Fremont, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/20 (2006.01); G01R 31/28 (2006.01); H01L 21/687 (2006.01); H05K 7/14 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2808 (2013.01); G01R 31/2893 (2013.01); H01L 21/687 (2013.01); H05K 7/1402 (2013.01); H05K 7/1412 (2013.01); H05K 7/1417 (2013.01);
Abstract
A tester apparatus is described. Various components contribute to the functionality of the tester apparatus, including an insertion and removal apparatus, thermal posts, independent gimbaling, the inclusion of a photo detector, a combination of thermal control methods, a detect circuitry in a socket lid, through posts with stand-offs, and a voltage retargeting.