The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2020

Filed:

Oct. 03, 2017
Applicant:

Disco Corporation, Tokyo, JP;

Inventors:

Tasuku Kojo, Tokyo, JP;

Koichi Shigematsu, Tokyo, JP;

Chang Yuan-Yang, Tokyo, JP;

Assignee:

DISCO CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23K 26/03 (2006.01); G01J 1/42 (2006.01); B23K 26/08 (2014.01); B23K 31/12 (2006.01); B23K 26/70 (2014.01); B23K 101/40 (2006.01);
U.S. Cl.
CPC ...
G01J 1/4257 (2013.01); B23K 26/032 (2013.01); B23K 26/0823 (2013.01); B23K 26/0853 (2013.01); B23K 26/0876 (2013.01); B23K 26/705 (2015.10); B23K 31/125 (2013.01); B23K 2101/40 (2018.08);
Abstract

A method of detecting a spot shape of a pulsed laser beam, includes applying a pulsed laser beam having a wavelength absorbable by an inspection wafer held on a chuck table continuously to the inspection wafer with a focused point on an upper surface of the inspection wafer thereby to form a plurality of laser spots on the upper surface of the inspection wafer. An image of the laser spots is captured, and profiles of shapes of the laser spots are extracted from the captured image of the laser spots. A degree of similarity between the captured image and the profile of an ideal laser spot shape is calculated and stored in a memory. The shapes of the laser spots are found to be improper if the calculated degree of similarity is lower than a threshold value.


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