The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2020

Filed:

May. 15, 2019
Applicant:

Mitutoyo Corporation, Kanagawa-ken, JP;

Inventor:

Joseph Daniel Tobiason, Bothell, WA (US);

Assignee:

Mitutoyo Corporation, Kanagawa-ken, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 5/38 (2006.01); G01D 5/347 (2006.01);
U.S. Cl.
CPC ...
G01D 5/34707 (2013.01); G01D 5/3473 (2013.01); G01D 5/38 (2013.01);
Abstract

An optical encoder configuration comprises a cylindrical or planar rotary scale including yawed grating bars, an illumination source, a structured illumination generating arrangement (SIGA) and a detector arrangement including a photodetector. The SIGA is configured to input source light to a first illumination region on the rotary scale which diffracts light to a beam deflector configuration which transmits the diffracted light in a form that provides a particular fringe pattern proximate to a second illumination region on the scale. The scale filters and outputs that light to form a detector fringe pattern of intensity bands that are long along the rotary measuring direction and relatively narrow and periodic along a detected fringe motion direction (DFMD) transverse to the rotary measuring direction. The photodetector is configured to detect a position of the intensity bands as a function of rotary scale displacement and provide corresponding displacement or position signals.


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