The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 2020
Filed:
Aug. 17, 2018
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventors:
Hiroyuki Mori, Shiga-ken, JP;
Keishi Okamoto, Kanagawa, JP;
Assignee:
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/66 (2006.01); H01L 23/498 (2006.01); H01L 21/48 (2006.01); G01R 31/26 (2020.01); G01R 31/28 (2006.01); G01R 31/44 (2020.01);
U.S. Cl.
CPC ...
H01L 22/32 (2013.01); G01R 31/2637 (2013.01); G01R 31/2884 (2013.01); G01R 31/44 (2013.01); H01L 21/486 (2013.01); H01L 22/14 (2013.01); H01L 23/49827 (2013.01); H01L 23/49838 (2013.01); H01L 23/49822 (2013.01);
Abstract
A sacrificial interposer test structure including a release layer, a dummy layer on the release layer, one or more conductive pads embedded in the dummy layer, wherein each of the one or more conductive pads has an exposed surface, and a tie layer on the dummy layer and on each exposed surface of the one or more conductive pads.